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Semiconductor devices. Micro-electromechanical devices - Tensile testing method of thin film materials has-digital — standard test severity classes

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— standard test severity classes

BS 7799-1:2005

BS EN 485-1:2008 replaces BS EN 485-1:1994 which has been withdrawn

Interface 9-1- Plug connector interface

It covers classification according to wear and appearance retention

Semiconductor devices. Micro-electromechanical devices - Tensile testing method of thin film materials has-digital — standard test severity classes

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